《英文msh詞典》Microscopy,Scanning Force
[入口詞] Microscopy,Scanning Force
[主題詞] Microscopy,Atomic Force
[英文釋義] A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.